- All sections
- G - Physics
- G01N - Investigating or analysing materials by determining their chemical or physical properties
- G01N 23/2055 - Analysing diffraction patterns
Patent holdings for IPC class G01N 23/2055
Total number of patents in this class: 172
10-year publication summary
|
0
|
2
|
10
|
10
|
29
|
22
|
22
|
23
|
33
|
6
|
| 2015 | 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Rigaku Corporation | 379 |
19 |
| The Regents of the University of California | 18943 |
6 |
| Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel, Ltd.) | 2865 |
4 |
| Oxford Instruments NanoTechnology Tools Limited | 145 |
4 |
| Bruker Technologies Ltd. | 100 |
4 |
| ASML Netherlands B.V. | 6816 |
3 |
| California Institute of Technology | 3884 |
3 |
| FEI Company | 851 |
3 |
| Sigray, Inc. | 68 |
3 |
| Malvern PANalytical B.V. | 124 |
3 |
| Bruker AXS, LLC | 8 |
3 |
| KLA Corporation | 1223 |
3 |
| Nova Ltd. | 145 |
3 |
| Semiconductor Energy Laboratory Co., Ltd. | 10902 |
2 |
| Sumitomo Chemical Company, Limited | 8808 |
2 |
| Commissariat à l'énergie atomique et aux energies alternatives | 10525 |
2 |
| Tsinghua University | 5426 |
2 |
| Toray Industries, Inc. | 6652 |
2 |
| National Institute of Advanced Industrial Science and Technology | 3677 |
2 |
| Apotex Inc. | 197 |
2 |
| Other owners | 97 |